LDRAunit

With our solutions, you can quickly and easily generate and execute tests at the unit and integration levels, both on the host (standalone or with target simulation) as well as on the target hardware. We provide test generation (test harness, test vectors, code stubs) and result-capture support for a wide range of host and target platforms. Optimised instrumentation technology lets you pull test information even off highly constrained 8- and 16-bit microcontrollers, and through high-performance 32- and 64-bit processors.

With that range of support, your team has a common unit testing and integration testing environment for multiple projects with different target platforms.