The new XJTAG® DFT plugin allows design engineers to identify and correct potential JTAG testability problems early in the design cycle. Because many IC packages are inaccessible for testing using physical probes, failure to provide JTAG test access to these chips could result in a board re-spin and an expensive project delay.
XJTAG DFT Assistant helps you validate the correct implementation of boundary scan chains*, as well as provides compliance to ‘Design For Test’ best practices.
What’s more, JTAG compliance can also unlock a range of other benefits for your board, which include faster prototype debug and device programming, as well as faster and more cost-effective manufacturing testing.
* Designers are not required to understand the underlying JTAG boundary scan technology to be able to use the plugin.